The program schedule includes topics around advances in MBE techniques, novel materials, and innovative new devices. The highlight of the conference will be an invited talk by the “Father of MBE,” Al Cho, on the historical development of the MBE technique.
Don't forget to visit the k-Space booth at the ICMBE Exhibition. The company produces MBE measurement tools for RHEED analysis as well as for thin-film stress and temperature measurement and control. For example, the kSA MOS measurement tool is currently being used for in situ stress monitoring and control at leading R&D and full thin-film production facilities worldwide.